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Загальна кількість знайдених документів : 16
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1.

Sukach A. N. 
Comparative study on influence of fetal bovine serum and serum of adult rat on cultivation of newborn rat neural cells [Електронний ресурс] / A. N. Sukach, M. V. Shevchenko, T. D. Liashenko // Biopolymers and cell. - 2014. - Vol. 30, № 5. - С. 394-399. - Режим доступу: http://nbuv.gov.ua/UJRN/BPK_2014_30_5_11
Попередній перегляд:   Завантажити - 493.434 Kb    Зміст випуску     Цитування
2.

Sukach A. V. 
Mechanisms of carrier transport in CdTe polycrystalline films [Електронний ресурс] / A. V. Sukach, V. V. Tetyorkin, N. M. Krolevec // Semiconductor physics, quantum electronics & optoelectronics. - 2010. - Vol. 13, № 2. - С. 221-225. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2010_13_2_23
Cadmium telluride (CdTe) polycrystalline films grown on glass ceramic substrates by a modified close-spaced vapor transport technique have been investigated. The as-grown films have columnar structure with the average grain sizes about 10 <$E mu roman m>. The in-plain direct current conductivity as a function of temperature and electric field has been investigated. The percolation conductivity is shown to be dominant at low temperatures (T << 250 K). At room temperature, the dominant transport mechanism is an activated process such as thermionic emission. The carrier transport across barriers is influenced by traps in the surface barrier regions. The non-annealed films exhibited stable electrical parameters and high photosensitivity during five-year storage under laboratory conditions.
Попередній перегляд:   Завантажити - 1.176 Mb    Зміст випуску    Реферативна БД     Цитування
3.

Sukach A. V. 
Tunneling current via dislocations in InAs and InSb infrared photodiodes [Електронний ресурс] / A. V. Sukach, V. V. Tetyorkin, N. M. Krolevec // Semiconductor physics, quantum electronics & optoelectronics. - 2011. - Vol. 14, № 4. - С. 416-420. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2011_14_4_9
Carrier transport mechanisms are investigated in InAs and InSb infrared photodiodes. The photodiodes were prepared by thermal diffusion of Cd and ion implantation of Be into InAs and InSb single-crystal substrates of n-type conductivity, respectively. The direct current was measured as a function of bias voltage and temperature. The excess tunneling current is observed in the investigated photodiodes at small forward bias voltages. Experimental proofs are obtained that dislocations are responsible for this current. A model for the tunneling current via dislocations is briefly discussed.
Попередній перегляд:   Завантажити - 134.371 Kb    Зміст випуску    Реферативна БД     Цитування
4.

Tetyorkin V. V. 
Photoluminescence studies of CdTe polycrystalline films [Електронний ресурс] / V. V. Tetyorkin, A. V. Sukach, S. V. Stariy, V. A. Boiko // Semiconductor physics, quantum electronics & optoelectronics. - 2012. - Vol. 15, № 4. - С. 340-344. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2012_15_4_9
Photoluminescence studies of CdTe polycrystalline films are reported. The films were grown using the modified close space sublimation technique on sapphire substrates. The mean grain size in the investigated films was ranged from 10 up to 360 <$E mu>m. The distinct spectral bands around 1,580 and 1,440 eV were observed at 77 K. These bands are attributed to shallow bound excitons at dislocations and deep defects, respectively. The intensity of luminescence related to dislocation defects is found to be proportional to the density of grain boundaries. The nature of grain boundaries in the investigated films has been briefly discussed.
Попередній перегляд:   Завантажити - 954.662 Kb    Зміст випуску    Реферативна БД     Цитування
5.

Tetyorkin V. V. 
Injection current and infrared photosensitivity in isotype p-PbTe/p-CdTe heterojunctions [Електронний ресурс] / V. V. Tetyorkin, A. V. Sukach, A. I. Tkachuk, S. P. Movchan // Semiconductor physics, quantum electronics & optoelectronics. - 2013. - Vol. 16, № 1. - С. 59-63. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2013_16_1_10
Iso-type p-PbTe/p-CdTe heterojunctions were grown on BaF2 substrates by using the hot-wall epitaxy technique. The growth details are presented. The carrier transport mechanism was investigated by means of the current-voltage measurements. At 77 К the dominant conduction mechanism was found to be the space-charge-limited current. The photovoltaic response in the long-wave infrared region with the half-peak cut-off wavelength ranged from 8,0 to 9,0 <$Emu>m was observed in these heterojunctions for the first time. The possible mechanism of the photoresponse is the internal photoemission of holes from p-PbTe across the heterojunction barrier.
Попередній перегляд:   Завантажити - 1.061 Mb    Зміст випуску    Реферативна БД     Цитування
6.

Sukach A. V. 
Heterostructure ohmic contacts to p-CdTe polycrystalline films [Електронний ресурс] / A. V. Sukach, V. V. Tetyorkin, A. I. Tkachuk // Semiconductor physics, quantum electronics & optoelectronics. - 2014. - Vol. 17, № 3. - С. 268-271. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2014_17_3_12
Heterostructure contacts p<^>+-PbTe/p-CdTe were prepared using the hot-wall technique on glassceramic substrates. It has been shown that the potential barrier at the p<^>+-PbTe/p-CdTe interface is not formed in the case of heavily doped lead telluride. That allows one to create ohmic heterocontacts of metal-p<^>+-PbTe/p-CdTe type. The transverse and in-plane transport of carriers has been investigated as a function of bias voltage and temperature. The current-voltage characteristics measured for the transverse arrangement of contacts exhibited ohmic behavior. The current-voltage characteristics of these contacts are determined by unipolar injection of holes from p<^>+-PbTe into p-CdTe. The inplane transport has been explained by presence of potential barriers at the grain boundaries. The potential barrier height has been estimated to be ~0,1 eV at room temperature. The mechanism of carrier transport is thermionic emission.
Попередній перегляд:   Завантажити - 1.097 Mb    Зміст випуску    Реферативна БД     Цитування
7.

Tetyorkin V. V. 
Conductivity type conversion in p-CdZnTe under pulsed laser irradiation [Електронний ресурс] / V. V. Tetyorkin, A. V. Sukach, N. M. Krolevec // Semiconductor physics, quantum electronics & optoelectronics. - 2014. - Vol. 17, № 3. - С. 291-294. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2014_17_3_16
Laser-induced surface modification is investigated in p-Cd0,9Zn0,1Te under irradiation with nanosecond pulses of YAG:Nd laser by using the power density 5 MW/cm<^>2. Conductivity type conversion of the near-surface region with the thickness of several micrometers is observed. The surface-barrier structures were prepared by electrolytic deposition of Au onto the irradiated surface. The spectral dependences of the photovoltaic response has been explained by formation of the graded band gap in the irradiated region. The direct current conductivity has been proved to be determined by the dislocation network.
Попередній перегляд:   Завантажити - 1.185 Mb    Зміст випуску    Реферативна БД     Цитування
8.

Sukach A. 
Carrier transport mechanisms in InSb diffusion p-n junctions [Електронний ресурс] / A. Sukach, V. Tetyorkin, A. Voroschenko, A. Tkachuk, M. Kravetskii, I. Lucyshyn // Semiconductor physics, quantum electronics & optoelectronics. - 2014. - Vol. 17, № 4. - С. 325-330. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2014_17_4_4
The linearly-graded p-n junctions were prepared by diffusion of cadmium into n-InSb(100) substrate with the electron concentration <$En~symbol Ы~1,6~cdot~10 sup 15 ~roman cm sup -3> at the temperature T = 77 K. Passivation and protection of mesa structures have been carried out using thin films of CdTe. Forward and reverse current-voltage characteristics were investigated within the temperature range 77...156 K. It has been found that the total dark current consists of generation-recombination and tunneling current components, which are dominant at high (T = 120...156 K) and low (T << 120 K) temperatures, respectively. Experimental results have been explained using the model of a nonhomogeneous p-n junction. It has been shown that in the linearly-graded p-n junction with the rather thick (~<$E1~mu m>) depletion region tunneling current flows through the states related to dislocations in the depletion region. The performed estimation of electrical parameters of diffusion InSb p-n junctions allows to predict behavior of InSb-based photodiodes at operation temperatures T >> 77 K.Carrier transport mechanisms have been investigated in linearly graded InSb p-n junctions prepared using thennal diffusion of Cd into single crystal substrates of n-type conductivity. The investigations were focused on the reverse current as a function of bias voltage and temperature. The obtained experimental data show that local inhomogeneities in the depletion region are responsible for the excess tunneling current observed in the reverse biased junctions. The inhomogeneities have been attributed to dislocations, precipitates or other extended defects. A phenomenological model is proposed to explain experimental data.
Попередній перегляд:   Завантажити - 1.33 Mb    Зміст випуску    Реферативна БД     Цитування
9.

Sukach A. V. 
Carrier transport mechanisms in reverse biased InSb p-n junctions [Електронний ресурс] / A. V. Sukach, V. V. Tetyorkin, A. I. Tkachuk // Semiconductor physics quantum electronics & optoelectronics. - 2015. - Vol. 18, № 3. - С. 267-271. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2015_18_3_7
The linearly-graded p-n junctions were prepared by diffusion of cadmium into n-InSb(100) substrate with the electron concentration <$En~symbol Ы~1,6~cdot~10 sup 15 ~roman cm sup -3> at the temperature T = 77 K. Passivation and protection of mesa structures have been carried out using thin films of CdTe. Forward and reverse current-voltage characteristics were investigated within the temperature range 77...156 K. It has been found that the total dark current consists of generation-recombination and tunneling current components, which are dominant at high (T = 120...156 K) and low (T << 120 K) temperatures, respectively. Experimental results have been explained using the model of a nonhomogeneous p-n junction. It has been shown that in the linearly-graded p-n junction with the rather thick (~<$E1~mu m>) depletion region tunneling current flows through the states related to dislocations in the depletion region. The performed estimation of electrical parameters of diffusion InSb p-n junctions allows to predict behavior of InSb-based photodiodes at operation temperatures T >> 77 K.Carrier transport mechanisms have been investigated in linearly graded InSb p-n junctions prepared using thennal diffusion of Cd into single crystal substrates of n-type conductivity. The investigations were focused on the reverse current as a function of bias voltage and temperature. The obtained experimental data show that local inhomogeneities in the depletion region are responsible for the excess tunneling current observed in the reverse biased junctions. The inhomogeneities have been attributed to dislocations, precipitates or other extended defects. A phenomenological model is proposed to explain experimental data.
Попередній перегляд:   Завантажити - 175.635 Kb    Зміст випуску    Реферативна БД     Цитування
10.

Tetyorkin V. V. 
Characterization of grain boundaries in CdTe polycrystalline films [Електронний ресурс] / V. V. Tetyorkin, A. V. Sukach, V. A. Boiko, A. I. Tkachuk // Semiconductor physics, quantum electronics & optoelectronics. - 2015. - Vol. 18, № 4. - С. 428-432. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2015_18_4_11
CdTe polycrystalline films with the average size of grains within the range 10 - 360 pm were grown on sapphire substrates by using the modified close-spaced sublimation technique. Transverse (across the film) and lateral (along the film's surface) conductivity as a function of bias voltage and temperature were measured using appropriate arrangement of contacts. The transverse conductivity exhibits ohmic behavior, whereas the lateral transport of carriers is dominated by potential barriers at the grain boundaries. The carrier concentration in the grains and the potential barrier height have been estimated. The inhomogeneous distribution of deep defects through the grains was found from the photoluminescence measurements.
Попередній перегляд:   Завантажити - 295.724 Kb    Зміст випуску    Реферативна БД     Цитування
11.

Sukach A. V. 
Electrical properties of InSb p-n junctions prepared by diffusion methods [Електронний ресурс] / A. V. Sukach, V. V. Tetyorkin, A. I. Tkachuk // Semiconductor physics, quantum electronics & optoelectronics. - 2016. - Vol. 19, № 3. - С. 295-298. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2016_19_3_11
InSb p-n junctions were prepared by three diffusion methods, including isothermal, two-temperature and two-stage diffusion processes. The current-voltage characteristics were measured as a function of temperature and bias voltage. The highest values of the resistance-area product at zero bias have been obtained for the junctions prepared using the two-stage diffusion process.
Попередній перегляд:   Завантажити - 132.751 Kb    Зміст випуску    Реферативна БД     Цитування
12.

Stariy S. V. 
Effect of thermal annealing on electrical and photoelectrical properties of n-InSb [Електронний ресурс] / S. V. Stariy, A. V. Sukach, V. V. Tetyorkin, V. O. Yukhymchuk, T. R. Stara // Semiconductor physics, quantum electronics & optoelectronics. - 2017. - Vol. 20, № 1. - С. 105-109. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2017_20_1_17
InSb wafers of n-type conductivity were annealed at 300, 370 and <$E400~symbol Р roman C> for 30 min in an open tube system under flowing argon ambient. The conductivity type conversion are revealed for the first time in samples with the electron concentration ~<$E1,0~cdot~10 sup 14 ~roman cm sup -3> for all annealing temperatures. Experimental evidences have been obtained that this phenomenon has a bulk character. In annealed samples the spectral response exhibits pronounced increase in the short-wave region. The effect of annealing on electrical and photoelectrical properties of n-InSb has been explained by formation of InSb antisites.
Попередній перегляд:   Завантажити - 175.573 Kb    Зміст випуску    Реферативна БД     Цитування
13.

Beketov G. V. 
Trap-assisted conductivity in anodic oxide on InSb [Електронний ресурс] / G. V. Beketov, A. V. Sukach, V. V. Tetyorkin, S. P. Trotsenko // Semiconductor physics, quantum electronics & optoelectronics. - 2017. - Vol. 20, № 4. - С. 470-474. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2017_20_4_14
The direct current conductivity of anodic oxide of InSb has been investigated as a function of applied bias and temperature. Proposed in this work is a model of conductivity that includes ohmic, trap-assisted tunneling and Poole - Frenkel conduction processes. Two defect states were found in the energy gap of the anodic oxide, which can be attributed to bulk traps. The asymmetry in the current-voltage characteristics is analyzed in terms of comparative distribution of the applied bias voltage between the anodic oxide and the depletion region in InSb.
Попередній перегляд:   Завантажити - 129.943 Kb    Зміст випуску    Реферативна БД     Цитування
14.

Tetyorkin V. V. 
S1/f noise and carrier transport mechanisms in InSb p + -n junctions [Електронний ресурс] / V. V. Tetyorkin, A. V. Sukach, A. I. Tkachuk, S. P. Trotsenko // Semiconductor physics, quantum electronics & optoelectronics. - 2018. - Vol. 21, № 4. - С. 374-379. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2018_21_4_9
Попередній перегляд:   Завантажити - 460.957 Kb    Зміст випуску     Цитування
15.

Sukach A. V. 
Shunt current in InAs diffused photodiodes [Електронний ресурс] / A. V. Sukach, V. V. Tetyorkin, A. I. Tkachuk // Semiconductor physics, quantum electronics & optoelectronics. - 2020. - Vol. 23, № 2. - С. 208-213. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2020_23_2_17
The shunt current has been investigated in p<^>+-n type InAs diffused photodiodes. The mesastructures were prepared by etching in <$Eroman {Br sub 2 ~-~HBr}> solution and sequentially etched in CP-4 and in a lactic acid based etchants. The surface of mesastructures was passivated in alcohol solution of Na2S. After each chemical treatment, the current-voltage and capacitance-voltage characteristics were measured as functions of bias voltage and temperature. It has been shown that the shunt current contains ohmic and non-ohmic components. The evidences have been obtained that the non-ohmic shunt current originates from the space-charge limited current in the surface inversion layer and the trap-assisted tunneling current in the bulk.
Попередній перегляд:   Завантажити - 671.072 Kb    Зміст випуску    Реферативна БД     Цитування
16.

Sukach A. N. 
Transplantation of cryopreserved rat fetal neural cells in suspension and in multicellular aggregates into rats with spinal cord injury [Електронний ресурс] / A. N. Sukach, A. S. Lebedinsky, O. V. Ochenashko, A. Yu. Petrenko // Клітинна та органна трансплантологія. - 2016. - Т. 4, № 1. - С. 22-28. - Режим доступу: http://nbuv.gov.ua/UJRN/ktot_2016_4_1_6
Попередній перегляд:   Завантажити - 2.6 Mb    Зміст випуску     Цитування
 
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